PT Journal
AU Kejzlar, P
   Svec, M
   Macajova, E
TI The Usage of Backscattered Electrons in Scanning Electron Microscopy
SO Manufacturing Technology Journal
PY 2014
BP 333
EP 336
VL 14
IS 3
DI 10.21062/ujep/x.2014/a/1213-2489/MT/14/3/333
DE Scanning Electron Microscopy; BSE; Structure
AB Secondary and backscaterred electrons are the most common signals used for imaging in the scanning electron microscopy. Generally, SE are used to obtain topographical contrast while BSE show differences in chemical composition (so called Z-contrast).The aim of the present work is to show possibilities and techniques to obtain not-so-common information using BSE, as e.g. orientation contrast, residual stress, different allotropic modifications, etc.
ER