PT  - JOURNAL ARTICLE
AU  - Kejzlar, Pavel
AU  - Švec, Martin
AU  - Macajová, Eva
TI  - The Usage of Backscattered Electrons in Scanning Electron Microscopy
DP  - 2014 Oct 1
TA  - Manufacturing Technology Journal
PG  - 333--336
VI  - 14
IP  - 3
AID - 10.21062/ujep/x.2014/a/1213-2489/MT/14/3/333
IS  - 12132489
AB  - Secondary and backscaterred electrons are the most common signals used for imaging in the scanning electron microscopy. Generally, SE are used to obtain topographical contrast while BSE show differences in chemical composition (so called Z-contrast).The aim of the present work is to show possibilities and techniques to obtain not-so-common information using BSE, as e.g. orientation contrast, residual stress, different allotropic modifications, etc.