RT Journal Article
SR Electronic
A1 Kejzlar, Pavel
A1 Švec, Martin
A1 Macajová, Eva
T1 The Usage of Backscattered Electrons in Scanning Electron Microscopy
JF Manufacturing Technology Journal
YR 2014
VO 14
IS 3
SP 333
OP 336
DO 10.21062/ujep/x.2014/a/1213-2489/MT/14/3/333
UL https://journalmt.com/artkey/mft-201403-0015.php
AB Secondary and backscaterred electrons are the most common signals used for imaging in the scanning electron microscopy. Generally, SE are used to obtain topographical contrast while BSE show differences in chemical composition (so called Z-contrast).The aim of the present work is to show possibilities and techniques to obtain not-so-common information using BSE, as e.g. orientation contrast, residual stress, different allotropic modifications, etc.